Alzate, Cristian H.

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A real-time manufacturing information exchange application between programmable logic controllers over a fault tolerant network
(2014) Alzate, Cristian H.; Manian, Vidya; College of Engineering; Rodríguez, Domingo; Hunt, Shawn D.; Department of Electrical and Computer Engineering; Vásquez-Urbano, Pedro
This thesis presents the development of a test method for diagnosing the presence of embedded systems failures caused by physical defects in the printed circuit board and electronic components. Specifically, the proposed methodology includes a set of topics and procedures required, including topics such as identifying embedded systems modules, test block design, measurement equipment configuration and results analysis. The effectiveness of this approach to identify catastrophic and parametric failures was evaluated using three embedded systems with similar topologies but different electrical designs, using components from different manufacturers and different feature to meet the requirements of experimental design methodology. The execution of the measurement is performed with a non-invasively current sensor designed to manage the delivery of pulses in the power supply lines of the device under test (DUT) and at the same time it measures the consumption of the demand the embedded system. The analysis of the results reveals a large percentage of detected flaws and patterns of similar behavior in the tested systems.