Escalona-Cruz, Pedro J.

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Automated characterization of the dynamic on-resistance (RDSon) in a power MOSFET
(2015) Escalona-Cruz, Pedro J.; Palomera-García, Rogelio; College of Engineering; Jimenez Cedeño, Manuel; Ducoudray-Acevedo, Gladys O.; Department of Electrical and Computer Engineering; Colon, Silvestre
The technological community is highly focused in the area of power electronics. Specifically, these efforts can be observed in the design of efficient power transistors that can handle known and unknown applications to come. Part of the design process is to obtain accurate characterization data from a device under test. This thesis presents the automation of extracting of the dynamic on-resistance (RDSon) of power MOSFETS using low cost equipment. The automation procedure is presented in a replicable and systematic environment. This work also presents the execution of two different measurements, single pulse and multiple pulse (stress test) measurements. The current setup is implemented for measuring dynamic on resistance in a three terminal packaged devices. RDSon measurements were taken under several conditions that verified the accuracy and precision of the extracted value. The results show that the implementation is capable of extracting the RDSon in an automated setup with minimal intervention from a user.