Rozo-Medina, Martha L.
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Publication Electrical characterization of sulfonated poly(styrene-isobutylene-styrene) triblock copolymer thin films(2015-05) Rozo-Medina, Martha L.; Padovani-Blanco, Agnes M.; College of Engineering; Curet Arana, Agnes; Suleiman, David; Department of Chemical Engineering; Montejo, LuisPolymers are a fundamental part of electronic systems and are widely used due to their low cost, ease of processing, and their wide range of mechanical and electrical properties. They have traditionally been used as passive components such as insulators and coatings, but more recent applications also include sensors, batteries, and membranes for low-temperature fuel cells. A thorough understanding of the electrical properties is necessary in order to improve their performance and to determine the best design conditions in any given application. The electrical properties of polymeric materials can be characterized through dielectric constant and loss tangent measurements. The first one represents the ability of the material to store potential energy, while the second one represents the losses related to heat dissipation factors. This work is focused on the electrical characterization of sulfonated poly (styreneisobutylene-styrene) (SIBS) triblock copolymer thin films. More specifically, the dielectric properties of SIBS were evaluated at low frequencies and as a function of critical parameters such as the sulfonation percent and polymer concentration. The sulfonation percent was varied in the range of 0% to 91%, whereas the polymer concentration was studied in the range of 5% to 9%. For the electrical characterization, metal-insulator-metal (MIM) parallel-plate capacitors were fabricated using a combination of physical vapor metal deposition and spincoating for the polymer films. The electrical measurements were performed using a Network Analyzer that can measure the complex impedance over frequencies in the range of 100 kHz to 1 MHz. The results show that the dielectric constant increases with sulfonation percent and polymer concentration, whereas the loss tangent increase with sulfonation percent, but decrease with polymer concentration. This work provides insights into the correlation of SIBS electrical properties and its chemical structure and morphology.