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dc.contributor.advisorSerrano, Guillermo
dc.contributor.authorDe La Cruz-Hernández, Gabriel E.
dc.description.abstractThis document shows the work that has been realized to design and simulate an integrated circuit that is capable of correcting mismatch and process variations using an automated temperature trimming circuit. The system will correct Bandgap References to have a temperature coefficient (TC) from 10 to 35 ppm from -40º to 100 ºC. To achieve this, the integrated circuit has an on-chip heating element, the output of the Bandgap Reference is tracked at all moments using a slope detector circuit to detect the maximum of the voltage reference. Using the slope detector as feedback, a logic circuit detects the change in sign of the slope. The trimming circuit resolution has been selected to ensure that the BGR will result in a more accurate first order cancellation; resulting in a TC of less than 40 ppm. To validate the circuit Monte Carlo simulation has been used; that will recreate mismatch and process variations to the BGR.en_US
dc.description.abstractEste documento muestra el trabajo que se ha realizado para diseñar y simular un circuito integrado que es capaz de corregir variaciones en proceso y errores de tamaño utilizando un circuito de ajuste de temperatura automático. El sistema corregirá las referencias de Bandgap para tener un coeficiente de temperatura (TC) de 10 a 35 ppm desde -40º hasta 100º C. Para lograr esto, el circuito integrado tiene un elemento de calentamiento en el chip, la salida de la referencia Bandgap se monitorea en todo momento usando un circuito detector de pendiente para detectar el máximo de la referencia de voltaje. Usando el detector de pendiente como retroalimentación, un circuito lógico detecta el cambio en el signo de la pendiente. La resolución del circuito de ajuste se ha seleccionado para garantizar que el BGR dé como resultado una cancelación más precisa de primer orden; dando como resultado una TC de menos de 40 ppm. Para validar el circuito, se ha realizado simulación Monte Carlo; que recreará las discrepancias y las variaciones de proceso en el BGR.en_US
dc.subjectAutomated temperature trimming circuit - Bandgap referenceen_US
dc.subject.lcshVoltage referencesen_US
dc.titleAutomated temperature trimming for mismatch and process variations in bandgap voltage referenceen_US
dc.rights.licenseAll rights reserveden_US
dc.rights.holder(c) 2018 Gabriel E. De La Cruz Hernándezen_US
dc.contributor.committeeDucoudray, Gladys O.
dc.contributor.committeePalomera, Rogelio
dc.contributor.committeeColom, Jose G.
dc.contributor.representativeHernández, Carlos Engineeringen_US
dc.contributor.collegeCollege of Engineeringen_US
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US

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    Items included under this collection are theses, dissertations, and project reports submitted as a requirement for completing a graduate degree at UPR-Mayagüez.

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