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dc.contributor.advisorTomar, Maharaj S.
dc.contributor.authorBermúdez-Baños, Luis A.
dc.description.abstractDue to the high dielectric constant of CaCu3Ti4O12, there is interest in related material systems for high dielectric applications. Accordingly, becomes interesting to study the effect of some divalent cations replacing calcium cation in the host structure. We have synthesized Ca1-xRxCu3Ti4O12, (R represents Mg, Sr and Zn) powders and thin films by sol-gel route for different compositions (e.g. X=0, 0.1, 0.2...). Thin films were deposited by spin coating followed by thermal treatment at different temperatures. X-ray diffraction and Raman spectroscopy were used for structural characterization of this material both for powder and thin films. The results show the possibility to produce highly stochiometric films for the compositions x ≤ 0.7 for R in all the cases. Dielectric constant of this material for different compositions has been determined using the Impedance Analyzer HP4294a (1KHz to 110MHz). Frequency-dependent measurements at room temperature shows high dielectric constant (ε=73x103 for f=105Hz) for x = 0. 0 and 0.2 (Ca1-xMgxCu3Ti4O12).en_US
dc.description.abstractDebido a la alta constante dieléctrica del CaCu3Ti4O12, hay mucho interés en sistemas relacionados con este material para muchas aplicaciones de altas propiedades dieléctricas. Por esta razón es interesante estudiar el efecto de algunos cationes divalentes para reemplazar el calcio en la estructura anfitriona. Nosotros sintetizamos Ca1-xRxCu3Ti4O12, (donde R representa Mg, Sr y Zn) por sol-gel para diferentes composiciones (por Ej. X = 0, 0.1, 0.2,...). Películas delgadas fueron depositadas por “spin coating” seguidas de tratamiento térmico a diferentes temperaturas. Estudios de difracción de rayos-X y espectroscopia Raman fueron usados para la caracterización de este material tanto en polvo como en películas. Los análisis de rayos-X y espectroscopia Raman muestran películas con alta estoiquiometría para composiciones de x ≤ 0.7 para todos los casos de R. La constante dieléctrica de este material fue determinada usando un “Impedance Analyzer HP4294a” (1KHz a 110MHz). Mediciones dependientes de la frecuencia a temperatura ambiente muestran alta constante dieléctrica (ε = 73x103 para f = 105Hz) para x = 0.0 y 0.2 (Ca1-xMgxCu3Ti4O12).en_US
dc.titleSíntesis y caracterización de materiales en el sistema Ca1-xRxCu3Ti4O12 (R = Mg, Sr, Zn)en_US
dc.rights.licenseAll rights reserveden_US
dc.rights.holder(c) 2004 Luis Alberto Bermúdez-Bañosen_US
dc.contributor.committeeCastellanos, Dorial
dc.contributor.committeeMarrero, Pablo
dc.contributor.representativePerales-Pérez, Oscar
dc.contributor.collegeCollege of Arts and Science - Scienceen_US
dc.contributor.departmentDepartment of Physicsen_US

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