Ortiz-Lago, Wilber

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    Characterization of sensors for CMS Phase II forward pixel detector
    (2018) Ortiz-Lago, Wilber; Ramírez-Vargas, Juan E.; College of Arts and Sciences – Sciences; Malik, Sudhir; López, Ángel M.; Santana Colón, Samuél; Department of Physics; Zapata Medina, Rocío
    The HL-LHC conditions of instantaneous peak luminosities up to 7.5*10^34 cm ^-2 s^-1 and an integrated luminosity of the order of 300fb^-1 would result in 1 MeV neutron equivalent fluence of 2.3 * 10^16 neq/cm^2and a total ionizing dose (TID) of 12MGy (1.2 Grad) at the center of CMS, where its innermost component, the Phase-2 Pixel Detector will be installed. The detector should survive the above radiation dose, handle projected hit rates of 3 Ghz/cm^2 at lowest radius, be able to separate and identify particles in extremely dense collision debris, deal with a pileup of 140-200 collisions per bunch crossing and have high impact parameter resolution. This along with physics goals translates into requiring a detector design that is more highly granular, has thinner sensors and smaller pixels, and a faster and radiation hard electronics. Sensors of planar type with pixel sizes six times smaller than currently used and 3D pixel types are being proposed to handle the above scenario. 3D sensors offer several improvements compared to the planar sensors like faster charge collection, radiation hard, lower depletion voltage but have higher noise (lower signal to noise ratio). Thin sensors yield smaller signals but offer less material budget. The work presented is based on the test-beam program at Fermilab designed to test sensors for the Phase-2 Pixel Detector. These sensors are bump bonded to PSI46dig readout chip (used currently with Phase-1 Detector) as these are the only ones available at the time of studies. The sensors are tested with a 120GeV/c proton beam at the Fermilab Meson Test-Beam Facility with a telescope made of eight planes of pixel modules to reconstruct tracks of the charged particles passing through the sensors tested (referred to as Detector Under Test (DUT)).