Aparicio-Moscoso, Yohan Aldemar

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A mathematical model to predict misalignment of SOIC packages in the presence of a dielectric fluid
(2020-12-04) Aparicio-Moscoso, Yohan Aldemar; Jiménez-Cedeño, Manuel; College of Engineering; Palomera-García, Rogelio; Serrano-Rivera, Guillermo J.; Department of Electrical and Computer Engineering; Rúa De La Asunción, Armando J.
This thesis presents the development of a mathematical model to predict misalignment of Small Outline Integrated Circuits (SOIC) packages in the presence of a dielectric fluid, when manipulated by a pick-and-place system. Specifically, the mathematical model included a set of analysis required with different thematic hydrodynamics of dielectric fluids, which influence the SOIC package while going through distinct physical media with different densities. The effectiveness of this mathematical model in order to reduce test times under precise and constant movements, was evaluated by means of parametric tests performed on three different SOIC models, using three types of dielectric fluids of different characteristics, to meet the requirements of experimental design methodology. The measurement execution was performed automatically through a sequential control software for movements and a data collection system designed to verify the correct position for each SOIC model in the ZIF socket. The analysis of the results reveals a high percentage of success of the mathematical model applied to similar behavior patterns in the tested systems.