De La Cruz-Hernández, Gabriel E.

Publication Search Results

Now showing 1 - 1 of 1

Automated temperature trimming for mismatch and process variations in bandgap voltage reference
(2018-05) De La Cruz-Hernández, Gabriel E.; Serrano, Guillermo; College of Engineering; Ducoudray, Gladys O.; Palomera, Rogelio; Colom, Jose G.; Department of Electrical and Computer Engineering; Hernández Hernández, Carlos I.
This document shows the work that has been realized to design and simulate an integrated circuit that is capable of correcting mismatch and process variations using an automated temperature trimming circuit. The system will correct Bandgap References to have a temperature coefficient (TC) from 10 to 35 ppm from -40º to 100 ºC. To achieve this, the integrated circuit has an on-chip heating element, the output of the Bandgap Reference is tracked at all moments using a slope detector circuit to detect the maximum of the voltage reference. Using the slope detector as feedback, a logic circuit detects the change in sign of the slope. The trimming circuit resolution has been selected to ensure that the BGR will result in a more accurate first order cancellation; resulting in a TC of less than 40 ppm. To validate the circuit Monte Carlo simulation has been used; that will recreate mismatch and process variations to the BGR.